Thanks,
Jerry
|       Nanometrics is a US-based MNC    and a leader in the design, manufacture and marketing of   high-performance process control metrology systems used in semiconductor   manufacturing. Nanometrics metrology systems measure various thin film   properties, critical dimensions, overlay control and optical, electrical and   material properties, including the structural composition of silicon and   compound semiconductor devices, during various steps of the manufacturing   process. These systems enable semiconductor manufacturers to improve yields,   increase productivity and lower their manufacturing costs.    |   |
|     Applications   Scientist (Taiwan)  |           |   
|     Responsibilities:   You will have the   opportunity to work closely with process engineers in Semiconductor Fabs to   provide Metrology solutions for complex multi-layer Thin Film measurements,    Optical Critical Dimension (Scatterometry) measurements and Overlay   measurements for sub-100nm features. Duties will include applications   development and characterization of cutting edge measurement technologies,   making technology/product presentations and technical training for customers.   You will also be responsible for high level Applications support of complex   measurement systems used to manufacture Semiconductor devices / integrated circuits. 
 
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