Thanks,
Jerry
Nanometrics is a US-based MNC and a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. | |
Applications Scientist (Taiwan) | |
Responsibilities: You will have the opportunity to work closely with process engineers in Semiconductor Fabs to provide Metrology solutions for complex multi-layer Thin Film measurements, Optical Critical Dimension (Scatterometry) measurements and Overlay measurements for sub-100nm features. Duties will include applications development and characterization of cutting edge measurement technologies, making technology/product presentations and technical training for customers. You will also be responsible for high level Applications support of complex measurement systems used to manufacture Semiconductor devices / integrated circuits.
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